Search Results for: Microscopes diffraction apparatus parts
secondary ion mass spectrometry (sims) are utilized in surface characterization of materials. microscopy (optical, electron, scanning probe, and confocal microscopy), surface analyzers (vapor adsorption analyzers, bet surface analyzers, gas adsorption analyzers, and electrokinetic analyzers), and x-ray diffraction
the pharmaceutical, biotechnology, water and environment testing, and food and agriculture industries. increasing demand for multiparameter testing instruments and rising awareness about safe water consumption are propelling the demand for electrochemical instruments throughout the world. laser diffraction...
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