Search Results for: Apparatus use x-ray
amorphous semiconductor material (class / ) non-single crystal, or recrystallized, material with specified crystal structure (e.g., specified crystal size or orientation) (class / ) non-single crystal, or recrystallized, material containing non-dopant additive, or alloy of semiconductor materials (e.g., ge x
si - x, polycrystalline silicon with dangling bond modifier) (class / ) field effect device in non-single crystal, or recrystallized, semiconductor material (class / ) schottky barrier to polycrystalline semiconductor material (class / ) plural recrystallized semiconductor layers (e.g., " -dimensional...
https://patents.justia.com/patents-by-us-classification/257
storage oscilloscope, digital panel meter, digital watt meter, digital frequency counter, digital lux meter, sound level meter, digital temperature humidity meter, digital temperature indicator, sine square function generator, standard resistance box (ertl), standard kv meter, thermal stability test apparatus
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