Search Results for: Compound optical
products offering improved sensitivity, enhanced speed, and higher throughput. spectroscopy technologies such as x-ray photoelectron spectroscopy (xps), auger electron spectroscopy (aes), and secondary ion mass spectrometry (sims) are utilized in surface characterization of materials. microscopy (optical
scientific instrumentations. inductively coupled plasma atomic emission spectroscopy (icp-aes), inductively coupled plasma mass spectrometry (icp-ms), combustion analysis, chemical method, electroanalytical method, x-ray fluorescence spectroscopy (xrf), fourier transform infrared (ftir) spectroscopy, and optical...
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